Analyse microstructurale au MEB environnemental d'une craie soumise à chargement hydrique et mécanique

Abstract : The Electron Scanning Environmental Microscope (ESEM) allows the observation of microstructural changes of geomaterials in their natural state, under controlled conditions of temperature and pressure. Unlike the traditional Scanning Electron Microscopy (SEM), ESEM technology does not require any preliminary treatment of the observed samples (i.e. dehydration, and eventually conductive coating). This has undeniable advantages to the analysis of geomaterials' microstructure. Although ESEM applications are nowadays recurrent in many research fields related to materials science, this investigation tool is still seldom used in geomechanics. In this note, we discuss some aspects associated with this technology when used for geomaterials. Examples of applications are presented for the particular case of partially saturated chalks observed under variable environmental conditions. Some perspectives on the development of this instrument in relation with geomechanical applications are also discussed.
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Submitted on : Friday, March 21, 2014 - 2:12:01 PM
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Claudia Sorgi, Vincenzo de Gennaro. Analyse microstructurale au MEB environnemental d'une craie soumise à chargement hydrique et mécanique. Comptes Rendus Géoscience, Elsevier Masson, 2007, 339 (7), pp.468-481. ⟨10.1016/j.crte.2007.06.003⟩. ⟨ineris-00963078⟩

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